Free Access
Issue |
Analusis
Volume 28, Number 1, January/February 2000
IR-Raman
|
|
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Page(s) | 15 - 21 | |
Section | Dossier | |
DOI | https://doi.org/10.1051/analusis:2000280015 |
Analusis 28, 15-21 (2000)
DOI: 10.1051/analusis:2000280015
© EDP Sciences, Wiley-VCH 2000
DOI: 10.1051/analusis:2000280015
Micro-Raman spectroscopy of the solid state: applications to semiconductors and thin films
T. JawhariWithout abstract
© EDP Sciences, Wiley-VCH 2000
First page of the article