Free Access
Issue
Analusis
Volume 28, Number 1, January/February 2000
IR-Raman
Page(s) 68 - 68
Section Dossier
DOI https://doi.org/10.1051/analusis:2000280068
Analusis 28, 68-68 (2000)
DOI: 10.1051/analusis:2000280068

Enhancing the lateral resolution in infrared microspectrometry by using synchrotron radiation: applications and perspectives

P. Dumas, G.L. Carr and G.P. Williams

Without abstract




© EDP Sciences, Wiley-VCH 2000
First page of the article