Free Access
| Issue |
Analusis
Volume 28, Number 1, January/February 2000
IR-Raman
|
|
|---|---|---|
| Page(s) | 68 - 68 | |
| Section | Dossier | |
| DOI | https://doi.org/10.1051/analusis:2000280068 | |
Analusis 28, 68-68 (2000)
DOI: 10.1051/analusis:2000280068
© EDP Sciences, Wiley-VCH 2000
DOI: 10.1051/analusis:2000280068
Enhancing the lateral resolution in infrared microspectrometry by using synchrotron radiation: applications and perspectives
P. Dumas, G.L. Carr and G.P. WilliamsWithout abstract
© EDP Sciences, Wiley-VCH 2000
First page of the article
