Free Access
| Issue |
Analusis
Volume 28, Number 1, January/February 2000
IR-Raman
|
|
|---|---|---|
| Page(s) | 53 - 63 | |
| Section | Dossier | |
| DOI | https://doi.org/10.1051/analusis:2000280053 | |
Analusis 28, 53-63 (2000)
DOI: 10.1051/analusis:2000280053
© EDP Sciences, Wiley-VCH 2000
DOI: 10.1051/analusis:2000280053
FTIR-microscopy as a tool for the measurement of the morphology of industrial, polymeric products
J.M. Chalmers and N.J. EverallWithout abstract
© EDP Sciences, Wiley-VCH 2000
First page of the article
